Sánchez Brea, Luis Miguel

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First Name
Luis Miguel
Last Name
Sánchez Brea
Universidad Complutense de Madrid
Faculty / Institute
Ciencias Físicas
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Now showing 1 - 5 of 5
  • Publication
    Fabrication effects in the optical performance of DOEs engraved with femtosecond lasers
    (SPIE, 2021-09-17) Soria García, Ángela; Fantova, Jorge; San Blas, Alejandro; Hoyo Muñoz, Jesús del; Sánchez Brea, Luis Miguel; Alda Serrano, Javier; Rodríguez González, Ainara; Olaizola Izquierdo, Santiago M.
    The development of DOEs fabrication techniques is continuously growing due to the wide range of industrial applications, such as beam manipulation or optical position encoders. In this work, we use Femtosecond laser direct writing to manufacture DOEs, which uses a simpler and more efficient way to fabricate amplitude binary masks. Also, we have analyzed the performance of the DOEs. The fabrication technique is validated since the experimental results are in accordance to numerical simulations.
  • Publication
    Calibration of the complete Jones matrix of SLMs
    (SPIE-International Society Optical Engineering, 2021-09) Hoyo Muñoz, Jesús del; Sánchez Brea, Luis Miguel; Soria García, Ángela
    Spatial light modulators are very common in many applications. They are used to implement amplitude, phase and polarization masks. In order to optimize its performance, it is important to characterize it, which means determining its Jones matrix. Here we present a method which consists on performing several intensity measurements for each gray level. It is simple enough that can be quickly performed, but offers much better results than previous methods.
  • Publication
    Gold-coated split laser-induced periodic surface structures as refractometric sensors
    (Elsevier, 2022-09-18) San Blas, Alejandro; Elshorbagy, Mahmoud Hamdy Mohamed; Olaizola Izquierdo, Santiago M.; Sánchez Brea, Luis Miguel; Rodríguez González, Ainara; Hoyo Muñoz, Jesús del; Granados, Eduardo; Soria García, Ángela; Pastor Villarrubia, Verónica; Alda, Javier
    The generation of surface plasmon resonances (SPR) in laser-induced periodic surface structures (LIPSS) allows their application in the field of optical sensing, such as the detection of refractive index variations in gases and liquids. We have fabricated gold-coated LIPSS nanostructures on stainless steel substrates by using femtosecond laser nano-ablation. This technique is a low-cost and high-throughput fabrication method applicable to fast and large-scale manufacturing. The depth profile of the fabricated LIPSS shows a central dip at the top of each ripple that split the geometry. The actual topography is modeled and included in a computational electromagnetism package to obtain the expected optical response under the experimental conditions. The measured and simulated spectral reflectances are compared, and the differences are explained by the departure of the fabricated LIPSS from the ideal topography. The experiments and simulations showed excellent agreement for the main spectral characteristics, like the Fano-like lineshapes of the spectral reflectance. This fitting provides the values used to determine the refractometric performance of the fabricated device, that shows a sensitivity of 518 nm/RIU and a figure of merit of 32 RIU−1 for an aqueous analyte. Our experimental results show that the fabricated devices are competitive in terms of cost and simplicity when compared to existing devices with similar performance.
  • Publication
    Calibration method to determine the complete Jones matrix of SLMs, Corrigendum (vol 151, 106914, 2022)
    (Elsevier Sci. Ltd., 2023-04) Hoyo Muñoz, Jesús del; Sánchez Brea, Luis Miguel; Soria García, Ángela
  • Publication
    Calibration method to determine the complete Jones matrix of SLMs
    (Elsevier, 2021-12-23) Hoyo Muñoz, Jesús del; Sánchez Brea, Luis Miguel; Soria García, Ángela
    We present a simple method to determine the polarimetric properties of spatial light modulators (SLMs) for each grey level by means of irradiance measurements. The Jones matrix of the SLM is obtained without any assumption about its properties, so it can be applied for more devices than previous works. This method is simple enough to be quickly performed, while offers better results than previous works, as it reduces the error in the prediction of transmission intensities in a factor between 5 and 380.