TY  - JOUR
AU  - López Alonso, José Manuel
AU  - Grumel, Eduardo
AU  - Cap, Nelly Lucía
AU  - Trivi, Marcelo
AU  - Rabal, Héctor
AU  - Alda Serrano, Javier
PY  - 2016
DO  - 10.1117/1.OE.55.12.121705
SN  - 0091-3286
UR  - https://hdl.handle.net/20.500.14352/18949
T2  - Optical Engineering
AB  - Abstract.  Speckle is being used as a characterization tool for the analysis of the dynamics of slow-varying phenomena occurring in biological and industrial samples at the surface or near-surface regions. The retrieved data take the form of a...
LA  - eng
M2  - 121705
PB  - SPIE
KW  - Principal components analysis
KW  - Dynamic speckle.
TI  - Characterization of spatial–temporal patterns in dynamic speckle sequences using principal component analysis
TY  - journal article
VL  - 55
ER  -