TY  - JOUR
AU  - Álvarez Herrero, Alberto
AU  - Guerrero Padrón, Héctor
AU  - Levy, David
AU  - Bernabeu Martínez, Eusebio
PY  - 2002
DO  - 10.1364/AO.41.006692
SN  - 1559-128X
UR  - https://hdl.handle.net/20.500.14352/59213
T2  - Applied Optics
AB  - An optical method to determine the nanostructure and the morphology of porous thin films is presented. This procedure is based on the response of a side-polished optical fiber with the film under study, when an adsorption-desorption cycle is carried...
LA  - eng
M2  - 6692
PB  - The Optical Society Of America
KW  - Principal Refractive-Indexes
KW  - Thin-Films
KW  - Titanium
KW  - Dioxide
KW  - Porosity
KW  - Oxide
TI  - Analysis of nanostructured porous films by measurement of adsorption isotherms with optical fiber and ellipsometry
TY  - journal article
VL  - 41
ER  -