%0 Journal Article
%A Del Hoyo Muñoz, Jesús
%A Porras, Joaquin Andres
%A Soria García, Ángela
%A Sánchez Brea, Luis Miguel
%A Pastor Villarrubia, Veronica
%A Hamdy Mohamed Elshorbagy, Mahmoud
%A Alda Serrano, Javier
%T Interferometric method for simultaneous characterization of retardance and fast axis of a retarder
%D 2024
%@ 0143-8166
%U https://hdl.handle.net/20.500.14352/104393
%X In this work, we propose a technique to simultaneously measure the absolute retardance and the fast axis azimuth of a retarder using a Michelson interferometer with polarization control. One of the mirrors is slightly tilted to obtain interference fringes with collimated beams. The sample to measure is rotated and the parameters are obtained from the fringes displacement. The technique does not require the use of additional previously characterized retarders in the measurement process, but only linear polarizers. The experimental results present errors of the order of 2◦ for the retardance and 1◦ for the azimuth of the fast axis.
%~