TY  - JOUR
AU  - Rodríguez Fernández, José
AU  - Carcelen, V.
AU  - Hidalgo Alcalde, Pedro
AU  - Vijayan, N.
AU  - Piqueras de Noriega, Javier
AU  - Sochinskii, N. V.
AU  - Pérez, J. M.
AU  - Diéguez, E.
PY  - 2004
DO  - 10.1088/0953-8984/16/2/013
SN  - 0953-8984
UR  - https://hdl.handle.net/20.500.14352/51064
T2  - Journal of Physics: Condensed Mater
AB  - The cathodoluminescence (CL) technique is used to analyse the radiative recombination properties of four distinct silicon carbide (SiC) samples: a 6H-SiC n^+ -type Lely wafer, two off-axis 4H-SiC epitaxial layers of n type and p type, and a (11 (2)...
LA  - eng
M2  - S107
PB  - Institute of Physics
KW  - Epitaxial Layers
KW  - Luminescence
TI  - Structural characterization of 6H-and 4H-SiC polytypes by means of cathodoluminescence and x-ray topography
TY  - journal article
VL  - 16
ER  -