TY  - JOUR
AU  - Panin, G. N.
AU  - Díaz-Guerra Viejo, Carlos
AU  - Piqueras De Noriega, Francisco Javier
PY  - 1998
DO  - 10.1063/1.121298
SN  - 0003-6951
UR  - https://hdl.handle.net/20.500.14352/59142
T2  - Applied physics Letters
AB  - A correlative study of the electrically active defects of CdxHg1-xTe and CdTe crystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined system. Charged structural and compositional defects were...
LA  - eng
M2  - 2139
PB  - Amer Inst Physics
KW  - Si(111)2x1 Surface
KW  - Microscopy
KW  - Cathodoluminescence
KW  - Cdte(001)
TI  - Characterization of charged defects in Cd_xHg_(1-x)Te and CdTe crystals by electron beam induced current and scanning tunneling spectroscopy
TY  - journal article
VL  - 72
ER  -