TY - JOUR AU - Rosado VĂ©lez, Jaime PY - 2019 DO - 10.1109/JSEN.2019.2938018 SN - 1530-437X UR - https://hdl.handle.net/20.500.14352/88577 T2 - IEEE Sensors Journal AB - A statistical model of the nonlinear response of silicon photomultipliers is presented. It includes losses of both the photodetection efficiency and the gain during pixel recovery periods as well as the effect of correlated and uncorrelated noise. The... LA - eng M2 - 12031 PB - Institute of Electrical and Electronics Engineers KW - Silicon photomultipliers KW - SiPM KW - Nonlinearity KW - statistical model TI - Modeling the Nonlinear Response of Silicon Photomultipliers TY - journal article VL - 19 ER -