TY  - JOUR
AU  - Aranda, Luis Alberto
AU  - Ruano Ramos, Óscar
AU  - García Herrero, Francisco Miguel
AU  - Maestro De La Cuerda, Juan Antonio
PY  - 2021
DO  - 10.1109/ACCESS.2021.3119633
UR  - https://hdl.handle.net/20.500.14352/109799
T2  - IEEE Access
AB  - There are many platforms and tools based on field-programmable gate array (FPGA) devices oriented to facilitate the reliability estimation of digital designs, but they are usually focused only on configuration memory errors since the configuration...
LA  - eng
M2  - 140676
PB  - IEEE
TI  - Reliability Analysis of ASIC Designs With Xilinx SRAM-Based FPGAs
TY  - journal article
VL  - 9
ER  -