RT Book, Section
T1 Defining a strategy to perform life-tests with analog devices
A1 Franco Peláez, Francisco Javier
A1 Palomar Trives, Carlos
A1 Liu, Shih Fu
A1 López Calle, Isabel
A1 Maestro De La Cuerda, Juan Antonio
A1 Agapito Serrano, Juan Andrés
AB Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 978-1-4577-0585-4
YR 2011
FD 2011
LK https://hdl.handle.net/20.500.14352/45548
UL https://hdl.handle.net/20.500.14352/45548
LA eng
NO ©IEEE ©2012 Elsevier B.VISSN : 0379-6566European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España)
NO Ministerio de Educación y Ciencia
DS Docta Complutense
RD 14 jun 2025