TY  - CHAP
AU  - Franco Peláez, Francisco Javier
AU  - Palomar Trives, Carlos
AU  - Liu, Shih Fu
AU  - López Calle, Isabel
AU  - Maestro De La Cuerda, Juan Antonio
AU  - Agapito Serrano, Juan Andrés
PY  - 2011
DO  - 10.1109/RADECS.2011.6131375
SN  - 978-1-4577-0585-4
UR  - https://hdl.handle.net/20.500.14352/45548
AB  - Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough...
LA  - eng
M2  - 92
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Comparators (circuits)
KW  - Integrated circuit testing
KW  - Life testing
KW  - Rradiation hardening (electronics)
KW  - Statistical analysis
KW  - Analog voltage comparators
KW  - Digital programmable device
KW  - Discrete analog devices
KW  - Integrated circuits
KW  - Memory elements
KW  - Natural radiation influence
KW  - Operational amplifiers
KW  - Scarce life tests
KW  - Single event transients
KW  - Statistical conclusions
KW  - Voltage references
KW  - Logic gates
KW  - Random access memory
KW  - Analog devices
KW  - Field tests
KW  - Life tests
KW  - Voltage comparator
TI  - Defining a strategy to perform life-tests with analog devices
TY  - book part
ER  -