TY  - JOUR
AU  - Balakrishnan, Narayanaswamy
AU  - Jaenada Malagón, María
AU  - Pardo Llorente, Leandro
PY  - 2024
DO  - 10.1016/j.cam.2023.115483
SN  - 0377-0427
UR  - https://hdl.handle.net/20.500.14352/104077
T2  - Journal of Computational and Applied Mathematics
AB  - Dealing with censored data is an important concern in reliability and survival analysis. Non-destructive one-shot devices are an extreme case of interval censoring, whereinwe only know if a device has failed or not before an inspection time. Besides,...
LA  - eng
M2  - 115483-1
PB  - Elsevier
KW  - Accelerated life tests
KW  - Density power divergence
KW  - Lognormal distribution
KW  - One-shot devices
KW  - Robustness
TI  - Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution
TY  - journal article
VL  - 437
ER  -