TY  - JOUR
AU  - Hidalgo Alcalde, Pedro
AU  - Palais, O.
AU  - Martinuzzi, S.
PY  - 2004
DO  - 10.1088/0953-8984/16/2/003
SN  - 0953-8984
UR  - https://hdl.handle.net/20.500.14352/51060
T2  - Journal of Physics-Condensed Matter
AB  - By means of a contactless microwave phase shift technique, the minority carrier lifetime and surface recombination velocity were measured in multicrystalline silicon wafers containing iron and chromium. The bulk lifetime can be deduced, leading to the...
LA  - eng
M2  - S19
PB  - Iop Publishing Ltd
KW  - Recombination
TI  - Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps
TY  - journal article
VL  - 16
ER  -