RT Journal Article
T1 Impedance spectroscopy of encapsulated single graphene layers
A1 Schmidt, Rainer
A1 Carrascoso Plana, Félix
A1 Nemes, Norbert Marcel
A1 Mompeán, Federico
A1 García-Hernández, Mar
AB In this work, we demonstrate the use of electrical impedance spectroscopy (EIS) for the disentanglement of several dielectric contributions in encapsulated single graphene layers. The dielectric data strongly vary qualitatively with the nominal graphene resistance. In the case of sufficiently low resistance of the graphene layers, the dielectric spectra are dominated by inductive contributions, which allow for disentanglement of the electrode/graphene interface resistance from the intrinsic graphene resistance by the application of an adequate equivalent circuit model. Higher resistance of the graphene layers leads to predominantly capacitive dielectric contributions, and the deconvolution is not feasible due to the experimental high frequency limit of the EIS technique.
PB MDPI
YR 2022
FD 2022-02-27
LK https://hdl.handle.net/20.500.14352/93789
UL https://hdl.handle.net/20.500.14352/93789
LA eng
NO Schmidt, R.; Carrascoso Plana, F.; Nemes, N.M.; Mompeán, F.; García-Hernández, M. Impedance Spectroscopy of Encapsulated Single Graphene Layers. Nanomaterials 2022, 12, 804. https://doi.org/10.3390/nano12050804
NO Unión Europea
NO Ministerio de Economía y Competitividad (España)
DS Docta Complutense
RD 22 abr 2025