TY  - JOUR
AU  - Sánchez Brea, Luis Miguel
AU  - Soria García, Angela
AU  - Andres Porras, Joaquín
AU  - Del Hoyo Muñoz, Jesús
AU  - Torcal Milla, Francisco José
AU  - Hamdy Mohamed Elshorbagy, Mahmoud
AU  - Pastor Villarrubia, Veronica
AU  - Alda Serrano, Javier
PY  - 2024
DO  - 10.1016/j.ijleo.2024.171900
SN  - 0030-4026
UR  - https://hdl.handle.net/20.500.14352/135173
T2  - Optik
AB  - The Thin Element Approximation (TEA) is widely used in diffraction analyses since it can be applied in efficient plane-to-plane propagation algorithms. While refinements have been developed for dielectric objects to obtain more accurate results, TEA...
LA  - eng
M2  - 171900-1
PB  - Elsevier
KW  - Diffraction
KW  - Diffractometry
KW  - Size measurement
KW  - Thin element approximation
KW  - Wave propagation method
TI  - Validity of thin element approximation in diffractometry of opaque thick objects
TY  - journal article
VL  - 311
ER  -