RT Journal Article
T1 Anomalous resistivity at the structural phase transition of polycrystalline SnTe
A1 Grassie, Alexander D. C.
A1 Agapito Serrano, Juan Andrés
A1 Gonzalez Espeso, Pablo
AB An excess resistivity has been observed in thin film polycrystalline samples of SnTe with low carrier concentration and is attributed to the additional scattering due to the phonon softening associated with the structural phase transition.
PB IOP Publishing
SN 0022-3719
YR 1979
FD 1979
LK https://hdl.handle.net/20.500.14352/65103
UL https://hdl.handle.net/20.500.14352/65103
LA eng
NO @ 1979 The Institute of Physics
NO British Council
DS Docta Complutense
RD 9 may 2025