TY  - JOUR
AU  - Grassie, Alexander D. C.
AU  - Agapito Serrano, Juan Andrés
AU  - Gonzalez Espeso, Pablo
PY  - 1979
SN  - 0022-3719
UR  - https://hdl.handle.net/20.500.14352/65103
T2  - Journal of physics C: Solid state physics
AB  - An excess resistivity has been observed in thin film polycrystalline samples of SnTe with low carrier concentration and is attributed to the additional scattering due to the phonon softening associated with the structural phase transition.
LA  - eng
M2  - 925
PB  - IOP Publishing
KW  - Resistivity
KW  - Semiconductors
KW  - SnTe
KW  - Temperature dependence
TI  - Anomalous resistivity at the structural phase transition of polycrystalline SnTe
TY  - journal article
VL  - 12
ER  -