%0 Journal Article
%A Panin, G. N.
%A Díaz-Guerra Viejo, Carlos
%A Piqueras de Noriega, Javier
%T Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques
%D 1998
%@ 1026-3489
%U https://hdl.handle.net/20.500.14352/59144
%~