RT Journal Article
T1 Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques
A1 Panin, G. N.
A1 Díaz-Guerra Viejo, Carlos
A1 Piqueras de Noriega, Javier
PB Mezhdunarodnaya Kniga
SN 1026-3489
YR 1998
FD 1998-03
LK https://hdl.handle.net/20.500.14352/59144
UL https://hdl.handle.net/20.500.14352/59144
DS Docta Complutense
RD 25 ago 2024