TY  - JOUR
AU  - Balakrishnan, Narayanaswamy
AU  - Castilla González, Elena María
AU  - Jaenada Malagón, María
AU  - Pardo Llorente, Leandro
PY  - 2022
UR  - https://hdl.handle.net/20.500.14352/71929
AB  - One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can continue...
LA  - eng
KW  - Methodology
KW  - Statistics Theory
TI  - Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
TY  - journal article
ER  -