RT Journal Article
T1 Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope
A1 Díaz-Guerra Viejo, Carlos
A1 Piqueras De Noriega, Francisco Javier
AB A correlative study of the electrically active grain boundary structure of ZnO polycrystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument. Current imaging tunneling spectroscopy (CITS) measurements reveal reduced surface band gaps, as compared with grain interiors, at the charged boundaries imaged by SEM-based remote electron beam induced current (REBIC). ZnO grain boundaries were also imaged in the STM-REBIC mode with a resolution of up to 20 nm. The contrast differences observed in the SEM-REBIC and STM-REBIC images are discussed in terms of the different experimental conditions used in both techniques.
PB American Institute of Physics
SN 0021-8979
YR 1999
FD 1999-08-15
LK https://hdl.handle.net/20.500.14352/59135
UL https://hdl.handle.net/20.500.14352/59135
LA eng
NO © 1999 American Institute of Physics.This work was supported by DGES through Project PB96-0639.
NO DGES
DS Docta Complutense
RD 8 abr 2025