TY  - JOUR
AU  - Korkian, Golnaz
AU  - Fabero Jiménez, Juan Carlos
AU  - Hubert, Guillaume
AU  - Rezaei, Mohammadreza
AU  - Mecha López, Hortensia
AU  - Franco Peláez, Francisco Javier
AU  - Puchner, Helmut
AU  - Clemente, Juan Antonio
PY  - 2020
DO  - 10.1109/TNS.2020.3025104
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/8261
T2  - IEEE transactions on nuclear science
AB  - In harsh radiation environments, it is well known that the angle of incidence of impinging particles against the surface of the operating devices has significant effects on their sensitivity. This article discusses the sensitivity underestimations...
LA  - eng
M2  - 2345
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Multiple-cell upsets
KW  - Bit upset
KW  - Geant4
KW  - Impact
KW  - Sram
KW  - Seu
KW  - Mcu
TI  - Experimental and Analytical Study of the Responses of Nanoscale Devices to Neutrons Impinging at Various Incident Angles
TY  - journal article
VL  - 67
ER  -