TY  - JOUR
AU  - Zaldivar, M.H.
AU  - Fernández Sánchez, Paloma
AU  - Piqueras De Noriega, Francisco Javier
PY  - 1998
DO  - 10.1063/1.366661
SN  - 0021-8979
UR  - https://hdl.handle.net/20.500.14352/59162
T2  - Journal of Applied Physics
AB  - Cathodoluminescence (CL) in the scanning electron microscope is used to investigate the nature of defects responsible for the luminescence associated with round and hexagonal-like topographic features of GaN:Si films. Round hillocks of the size of a...
LA  - eng
M2  - 462
PB  - American Institute of Physics
TI  - Luminescence from growth topographic features in GaN : Si films
TY  - journal article
VL  - 83
ER  -