TY  - CPAPER
AU  - Palomar Trives, Carlos
AU  - López Calle, Isabel
AU  - Franco Peláez, Francisco Javier
AU  - González Izquierdo, Jesús
AU  - Agapito Serrano, Juan Andrés
PY  - 2011
UR  - https://hdl.handle.net/20.500.14352/45920
AB  - Laser tests on a power operational amplifier were performed to investigate its sensitivity to single event transients. These tests apparently point out to this device being quite insensitive to single event transients so it would become a good...
LA  - eng
M2  - 889
KW  - Integrated circuit testing
KW  - Laser beam applications
KW  - Operational amplifiers
KW  - Power amplifiers
KW  - Radiation effects
KW  - Laser test
KW  - Power operational amplifier
KW  - Power system
KW  - Radiation environments
KW  - Single event transients
KW  - Junctions
KW  - Lasers
KW  - Power supplies
KW  - Resistors
KW  - Transient analysis
KW  - Transistors
KW  - Laser irradiation
KW  - OPA541
KW  - Power devices
KW  - Single-photon absorption
TI  - Laser tests on a power operational amplifier
TY  - conference paper
ER  -