RT Journal Article
T1 Mechanical-alloying and lattice distortions in ball-milled CuFe
A1 Harris, V. G.
A1 Das, , B.N.
A1 Woicik, J. C.
A1 Crespo del Arco, Patricia
A1 Hemando, A.
A1 Garcia Escorial, A.
AB A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe_80B_20 thin films (t=15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative atomic fraction of each crystalline phase present. This fitting scheme provides a means for the quantitative treatment of crystallization and precipitation kinetics in thin films and multilayered structures.
PB Editions Physique
SN 1155-4339
YR 1997
FD 1997-04
LK https://hdl.handle.net/20.500.14352/60117
UL https://hdl.handle.net/20.500.14352/60117
LA eng
NO ©Editions Physique.EDP Sciences.This research was carried out, in part, at the National Synchrotron Light Source (Brookhaven National Laboratories, Upton, NY), which is sponsored by the U.S. Department of Energy.
DS Docta Complutense
RD 2 may 2024