%0 Book Section
%T Using optimization techniques to characterize irradiated CMOS analog switches
publisher INTA
%D 2004
%U 84-930056-1-4
%@ https://hdl.handle.net/20.500.14352/53399
%X The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.
%~