RT Book, Section
T1 Using optimization techniques to characterize irradiated CMOS analog switches
A1 Zong, Yi
A1 Franco Peláez, Francisco Javier
A1 Agapito Serrano, Juan Andrés
AB The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.
PB INTA
SN 84-930056-1-4
YR 2004
FD 2004-09-22
LK https://hdl.handle.net/20.500.14352/53399
UL https://hdl.handle.net/20.500.14352/53399
LA eng
NO Radiation Effects on Components and Systems (RADECS 2004) (5. 2004. Madrid)This work was supported by the cooperation agreement K746/LHC between CERN & UCM, by the Spanish Research Agency CICYT (FPA2002-00912) and partially supported by Instituto Tecnológico e Nuclear of Portugal.
NO Ministerio de Educación y Ciencia
NO CERN
NO Portuguese Research Agency (ICCTI)
NO CICYT
NO Universidad Complutense de Madrid
DS Docta Complutense
RD 27 abr 2025