TY  - CHAP
AU  - Zong, Yi
AU  - Franco Peláez, Francisco Javier
AU  - Agapito Serrano, Juan Andrés
PY  - 2004
SN  - 84-930056-1-4
UR  - https://hdl.handle.net/20.500.14352/53399
T2  - Proceedings of the 2004 Radiation Effects on Components and Systems Workshop
AB  - The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.
LA  - eng
M2  - 279
PB  - INTA
KW  - Analog switches
KW  - COTS
KW  - Neutron effects
KW  - Optimization
KW  - TID effects.
TI  - Using optimization techniques to characterize irradiated CMOS analog switches
TY  - book part
ER  -