TY  - JOUR
AU  - Panin, G. N.
AU  - Fernández Sánchez, Paloma
AU  - Piqueras de Noriega, Javier
PY  - 1996
DO  - 10.1088/0268-1242/11/9/018
SN  - 0268-1242
UR  - https://hdl.handle.net/20.500.14352/59208
T2  - Semiconductor Science and Technology
AB  - The effect of ion milling on the defect structure of CdTe crystals has been investigated in the scanning electron microscope by cathodoluminescence. Enhancement in the luminescence intensity is observed after ion treatment. Luminescence spectra of...
LA  - eng
M2  - 1354
PB  - IOP Publishing Ltd
KW  - Deep Centers
KW  - Cathodoluminescence
KW  - Conversion Hg_(1-X)Cd_xTe
TI  - Effect of ion beam milling on the defect structure of CdTe
TY  - journal article
VL  - 11
ER  -