RT Journal Article
T1 Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model
A1 Balakrishnan, Narayanaswamy
A1 Castilla González, Elena María
A1 Martín Apaolaza, Nirian
A1 Pardo Llorente, Leandro
AB Classical inferential methods for one-shot device testing data from an accelerated life-test are based on maximum likelihood estimators (MLEs) of model parameters. However, the lack of robustness of MLE is well-known. In this article, we develop robust estimators for one-shot device testing by assuming a Weibull distribution as a lifetime model. Wald-type tests based on these estimators are also developed. Their robustness properties are evaluated both theoretically and empirically, through an extensive simulation study. Finally, the methods of inference proposed are applied to three numerical examples. Results obtained from both Monte Carlo simulations and numerical studies show the proposed estimators to be a robust alternative to MLEs.
PB Institute of Electrical and Electronics Engineers
YR 2020
FD 2020-09
LK https://hdl.handle.net/20.500.14352/93697
UL https://hdl.handle.net/20.500.14352/93697
LA eng
NO N. Balakrishnan, E. Castilla, N. Martín and L. Pardo, "Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model," in IEEE Transactions on Reliability, vol. 69, no. 3, pp. 937-953, Sept. 2020, doi: 10.1109/TR.2019.2954385.
DS Docta Complutense
RD 7 abr 2025