TY  - JOUR
AU  - Balakrishnan, Narayanaswamy
AU  - Castilla González, Elena María
AU  - Martín Apaolaza, Nirian
AU  - Pardo Llorente, Leandro
PY  - 2020
DO  - 10.1109/TR.2019.2954385
UR  - https://hdl.handle.net/20.500.14352/93697
T2  - IEEE Transactions on Reliability
AB  - Classical inferential methods for one-shot device testing data from an accelerated life-test are based on maximum likelihood estimators (MLEs) of model parameters. However, the lack of robustness of MLE is well-known. In this article, we develop...
LA  - eng
M2  - 937
PB  - Institute of Electrical and Electronics Engineers
KW  - Exponential distribution
KW  - Minimum density power divergence (DPD) estimator
KW  - One-shot devices
KW  - Robustness
KW  - Wald-type tests
TI  - Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model
TY  - journal article
VL  - 69
ER  -