%0 Book Section
%T Laser induced single events in SRAMs
publisher IEEE-Inst Electrical Electronics Engineers Inc
%D 2013
%U 978-1-4673-4666-5
%@ https://hdl.handle.net/20.500.14352/35721
%X This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.
%~