RT Journal Article
T1 Accuracy of nonoscillating one-port noise measurements
A1 Miranda Pantoja, José Miguel
A1 Sebastián Franco, José Luis
AB This paper presents a detailed analysis of the accuracy of nonoscillating one-port device noise measurements. A new expression is given for the calculation of the noise temperature from parameters that can be measured directly by using either a power sensor or a noise meter with the capability of making power measurements. A general expression for the DUT noise temperature error function is also obtained, which enables the authors to study how the noise measurement accuracy is affected by a number of different factors. This expression has been found very useful in order to study how the accuracy can be improved in a given noise measurement system. The error function has been applied to evaluate the uncertainty of Schottky barrier device noise measurements.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 0018-9456
YR 1995
FD 1995-08
LK https://hdl.handle.net/20.500.14352/58959
UL https://hdl.handle.net/20.500.14352/58959
LA eng
NO © 1995 IEEE. This work was developed at the Institut fur Hochfrequenztechnik of Darmstadt. Special acknowledgment is given to Professor H. L. Hartnagel, who has facilitated the cooperation between the two Universities involved in this work, making many stimulating discussions possible. The authors also wish to thank J.-M. Miao and R. Riemenschneider for their assistance in the automation of the measurements, and J. D. Gallego for his valuable suggestions. Finally, Dr. L. Vázquez is acknowledged for all the administrative work.
DS Docta Complutense
RD 16 abr 2025