TY  - JOUR
AU  - Miranda Pantoja, José Miguel
AU  - Sebastián Franco, José Luis
PY  - 1995
DO  - 10.1109/19.392870
SN  - 0018-9456
UR  - https://hdl.handle.net/20.500.14352/58959
T2  - IEEE Transaction on instrumentation and measurement
AB  - This paper presents a detailed analysis of the accuracy of nonoscillating one-port device noise measurements. A new expression is given for the calculation of the noise temperature from parameters that can be measured directly by using either a power...
LA  - eng
M2  - 853
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Schottky-Barrier Diodes
KW  - Fabrication
KW  - Design.
TI  - Accuracy of nonoscillating one-port noise measurements
TY  - journal article
VL  - 44
ER  -