TY  - JOUR
AU  - Méndez Martín, Bianchi
AU  - Piqueras de Noriega, Javier
PY  - 1992
DO  - 10.1063/1.107485
SN  - 0003-6951
UR  - https://hdl.handle.net/20.500.14352/58995
T2  - Applied Physics Letters
AB  - A series of GaAs wafers with different doping levels and electrical resistivity has been used to investigate the scanning electron acoustic microscopy (SEAM) application to the characterization of this material. It has been found that SEAM is...
LA  - eng
M2  - 1357
PB  - Amer Inst Physics
KW  - Signal
TI  - Application of scanning electron acoustic microscopy to the characterization of n-type and semiinsulating GaAs
TY  - journal article
VL  - 60
ER  -