RT Journal Article
T1 Cathodoluminescence from nanocrystalline silicon films in the scanning electron microscope
A1 Méndez Martín, María Bianchi
A1 Piqueras De Noriega, Francisco Javier
A1 Plugaru, R
A1 Craciun, G.
A1 Nastase, N.
A1 Cremades Rodríguez, Ana Isabel
A1 Nogales Díaz, Emilio
AB Luminescence emission of nanocrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As deposited films show visible luminescence with dominant blue band as well as a red band. The evolution of CL bands after implantation and anodization treatments is investigated. Our results suggest that the dominant blue band has a complex character with a component at 400 nm which appears related to quantum size effects.
PB Trans Tech-Scitec Publications Ltd
SN 1012-0394
YR 1998
FD 1998
LK https://hdl.handle.net/20.500.14352/58850
UL https://hdl.handle.net/20.500.14352/58850
DS Docta Complutense
RD 7 abr 2025