TY  - THES
AU  - Gil Fernández, Raúl
AU  - León González, Daniel
A3  - Clemente Barreira, Juan Antonio
A3  - Fabero Jiménez, Juan Carlos
PY  - 2019
UR  - https://hdl.handle.net/20.500.14352/15273
AB  - Electronic components are often exposed to external radiation that may interfere with their normal operation. This becomes particularly relevant for high-scale of integration parts and when said components are used in harsh environments such as in...
AB  - Los componentes electrónicos suelen estar expuestos a radiaciones externas que pueden interferir con su funcionamiento normal. Esto es particularmente relevante cuando componentes con alta escala de integración se utilizan en entornos hostiles, como...
LA  - eng
KW  - Radiation effects on non-volatile memories
KW  - fault tolerance
KW  - memory test platform
KW  - READAR-II
KW  - Efectos de radiación en memorias no volátiles
KW  - tolerancia a fallos
KW  - plataforma de pruebas para memorias
TI  - Design of a test platform for studying radiation effects on SPI FRAM and I² C CMOS non-volatile memories
M3  - bachelor thesis
ER  -