RT Book, Section
T1 The Selection of a radiation-tolerant DAC for the LHC (Part II: CMOS technology)
A1 Franco Peláez, Francisco Javier
A1 Lozano Rogado, Jesús
A1 Agapito Serrano, Juan Andrés
AB Total dose & neutron tests on commercial CMOS digital-to-analog converters have been carried out. These results are related to those ones presented in the previous paper. This kind of devices is much more sensitive to ionizing radiation than to neutrons. That radiation changes the value of the MOSFET threshold voltage and this can put digital circuits out of action. In this case, the gradual destruction of the digital inputs was observed as a diminution of the output voltage levels. Also, the gamma radiation generates leakage currents that increase the consumption. Due to these converters tolerated less total radiation dose, their use in the LHC has been refused and the fast bipolar technology converters will be employed.
PB Instituto de Microelectrónica de Barcelona CNM-CSIC
SN 84-607-6770-1
YR 2003
FD 2003-02-14
LK https://hdl.handle.net/20.500.14352/53402
UL https://hdl.handle.net/20.500.14352/53402
LA eng
NO Conferencia de Dispositivos Electrónicos (CDE 2003) (4. 2003. Calella de la Costa, España).Spanish Conference on Electron Devices.
NO Ministerio de Educación y Ciencia
NO CERN
NO Portuguese Research Agency (ICCTI)
DS Docta Complutense
RD 4 abr 2025