TY  - JOUR
AU  - Fabero Jiménez, Juan Carlos
AU  - Korkian, Golnaz
AU  - Franco, Francisco J.
AU  - Hubert, Guillaume
AU  - Mecha López, Hortensia
AU  - Letiche, Manon
AU  - Clemente Barreira, Juan Antonio
PY  - 2023
DO  - 10.1016/j.micpro.2022.104743
SN  - 0141-9331
UR  - https://hdl.handle.net/20.500.14352/72824
T2  - Microprocessors and Microsystems
AB  - This paper provides an experimental study of the single-event upset (SEU) susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) Xilinx Artix-7 FPGA under different angles of incidence. Experimental results...
LA  - eng
M2  - 104743
PB  - Elsevier
KW  - FPGA
KW  - Thermal neutrons
KW  - Radiation hardness
KW  - Angle of incidence
KW  - Soft error
TI  - SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles
TY  - journal article
VL  - 96
ER  -