TY  - CHAP
AU  - Nogales Díaz, Emilio
AU  - Méndez Martín, Bianchi
AU  - Piqueras de Noriega, Javier
AU  - Plugaru, R.
PY  - 2003
SN  - 1-55899-675-3
SN  - 0272-9172
UR  - https://hdl.handle.net/20.500.14352/60809
T2  - Optical Microestructuras Characterization of Semiconductors
AB  - Electrically active regions of nanocrystalline silicon (nc-Si) films as well as of a p-type crystalline silicon (c-Si) wafer have been investigated by using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument....
PB  - Materials Research Society
KW  - Beam-Induced Current
KW  - Scanning-Tunneling-Microscopy
KW  - Grain-Boundaries
KW  - Porous Silicon
KW  - Luminescence
KW  - Spectroscopy
TI  - STM-REBIC study of nanocrystalline and crystalline silicon
TY  - book part
ER  -