RT Journal Article
T1 Optical technique for the automatic detection and measurement of surface defects on thin metallic wires
A1 Sánchez Brea, Luis Miguel
A1 Siegmann, Philip
A1 Rebollo, María Aurora
A1 Bernabeu Martínez, Eusebio
AB In industrial applications of thin metallic wires it is important to characterize the surface defects of the wires. We present an optical technique for the automatic detection of surface defects on thin metallic wires (diameters, 50–2000 µm) that can be used in on-line systems for surface quality control. This technique is based on the intensity variations on the scattered cone generated when the wire is illuminated with a beam at oblique incidence. Our results are compared with those obtained by atomic-force microscopy and scanning-electron microscopy.
PB The Optical Society Of America
SN 1559-128X
YR 2000
FD 2000-02-01
LK https://hdl.handle.net/20.500.14352/59240
UL https://hdl.handle.net/20.500.14352/59240
LA eng
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NO © Optical Society of America.The authors are grateful to A. González-Cano for his suggestions and discussions in the development of this research. The authors also express their gratitude to the European Union (EU) for the financial support of this research within the framework of EU research program SMT4, Standards Measurement and Testing; project SMT4-CT97-2184, DEFCYL: Detection of Defects in Cylindrical Surfaces, and Comisión Interministerial de Ciencia y Tecnología of Spain project TAP-98-1358-CE.
NO Unión Europea (UE)
NO Comisión Interministerial de Ciencia y Tecnología (CICYT), España
DS Docta Complutense
RD 30 abr 2024