TY  - JOUR
AU  - Sánchez Brea, Luis Miguel
AU  - Siegmann, Philip
AU  - Rebollo, María Aurora
AU  - Bernabeu Martínez, Eusebio
PY  - 2000
DO  - 10.1364/AO.39.000539
SN  - 1559-128X
UR  - https://hdl.handle.net/20.500.14352/59240
T2  - Applied Optics
AB  - In industrial applications of thin metallic wires it is important to characterize the surface defects of the wires. We present an optical technique for the automatic detection of surface defects on thin metallic wires (diameters, 50–2000 µm) that can...
LA  - eng
M2  - 539
PB  - The Optical Society Of America
KW  - Optics
TI  - Optical technique for the automatic detection and measurement of surface defects on thin metallic wires
TY  - journal article
VL  - 39
ER  -