TY  - JOUR
AU  - Aranda, Luis Alberto
AU  - Ruano Ramos, Óscar
AU  - García Herrero, Francisco Miguel
AU  - Maestro De La Cuerda, Juan Antonio
PY  - 2021
DO  - 10.1109/TCSII.2021.3105558
UR  - https://hdl.handle.net/20.500.14352/110021
T2  - IEEE Transactions on Circuits and Systems II: Express Briefs
AB  - Fault emulation in field-programmable gate arrays (FPGAs) is a popular alternative to test the reliability of a design due to its low cost and high availability compared to traditional radiation-based approaches. Fault emulation is an instrumentation...
LA  - eng
PB  - IEEE
TI  - ACME-2: Improving the Extraction of Essential Bits in Xilinx SRAM-Based FPGAs
TY  - journal article
VL  - 69
ER  -