RT Journal Article
T1 Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests
A1 Franco Peláez, Francisco Javier
A1 Clemente Barreira, Juan Antonio
A1 Korkian, Golnaz
A1 Fabero Jiménez, Juan Carlos
A1 Mecha López, Hortensia
A1 Velazco, Raoul
AB In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the ``birthday statistics'' have been proposed to estimate the accuracy of the experimental results. In this paper, simple formulae are proposed to determine the expected number of false 2-bit and 3-bit MCUs from the number of bitflips, memory size and the method used to search multiple events. These expressions are validated using Monte Carlo simulations and experimental data. Also, a technique is proposed to refine experimental data and thus partially removing possible false events. Finally, it is demonstrated that there is a physical limit to determine the cross section of memories with arbitrary accuracy from a single experiment.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 0018-9499
YR 2020
FD 2020
LK https://hdl.handle.net/20.500.14352/6087
UL https://hdl.handle.net/20.500.14352/6087
LA eng
NO Ministerio de Economía y Competitividad (MINECO)
DS Docta Complutense
RD 11 abr 2025