TY  - JOUR
AU  - Franco Peláez, Francisco Javier
AU  - Clemente Barreira, Juan Antonio
AU  - Korkian, Golnaz
AU  - Fabero Jiménez, Juan Carlos
AU  - Mecha López, Hortensia
AU  - Velazco, Raoul
PY  - 2020
DO  - 10.1109/TNS.2020.2977698
SN  - 0018-9499
UR  - https://hdl.handle.net/20.500.14352/6087
T2  - IEEE Transactions on Nuclear Science
AB  - In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the ``birthday statistics'' have been proposed to estimate...
LA  - eng
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Birtdhay Statistics
KW  - FPGA
KW  - SEU
KW  - SRAM
TI  - Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests
TY  - journal article
ER  -