TY  - JOUR
AU  - Rivera Calzada, Alberto Carlos
AU  - Santamaría Sánchez-Barriga, Jacobo
AU  - León Yebra, Carlos
PY  - 2001
DO  - 10.1063/1.1343852
SN  - 0003-6951
UR  - https://hdl.handle.net/20.500.14352/59643
T2  - Applied physics letters
AB  - We report on complex admittance measurements on ZrO_(2):Y_(2)O_(3) (YSZ) thin films in the parallel plate geometry. Highly textured YSZ thin films, grown by rf sputtering, allow measuring complex admittance free of the effect of charge blocking at...
LA  - eng
M2  - 610
PB  - American Institute of Physics
KW  - Ionic-conductivity
KW  - Glasses
KW  - Crystals
KW  - Dynamics.
TI  - Electrical conductivity relaxation in thin-film yttria-stabilized zirconia
TY  - journal article
VL  - 78
ER  -