%0 Journal Article
%A Fabero Jiménez, Juan Carlos
%A Mecha López, Hortensia
%A Franco Peláez, Francisco Javier
%A Clemente Barreira, Juan Antonio
%A Korkian, Golnaz
%A Rey, Solenne
%A Cheymol, Benjamin
%A Baylac, Maud
%A Hubert, Guillaume
%A Velazco, Raoul
%T Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-based FPGA in Static Mode
%D 2020
%@ 0018-9499
%U https://hdl.handle.net/20.500.14352/6088
%X A sensitivity characterization of a Xilinx Artix-7 FPGA against 14.2 MeV neutrons is presented. The content of the internal SRAMs and flip-flops were downloaded in a PC and compared with a golden version of it. Flipped cells were identified and classified as cells of the configuration RAM, BRAM, or flip-flops. SBUs and MCUs with multiplicities ranging from 2 to 8 were identified using a statistical method. Possible shapes of multiple events are also investigated, showing a trend to follow wordlines. Finally, MUSCA SEP3 was used to make assesment for actual environments and an improvement of SEU injection test is proposed.
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