RT Journal Article
T1 ‘‘Charge Leakage’’ at LaMnO_3/SrTiO_3 Interfaces
A1 Garcia Barriocanal, Javier
A1 Bruno, Flavio Yair
A1 Rivera Calzada, Alberto Carlos
A1 Sefrioui Khamali, Zouhair
A1 Nemes, Norbert Marcel
A1 Garcia Hernández, Mar
A1 Rubio Zuazo, Juan
A1 Castro, German R.
A1 Varela Del Arco, María
A1 Pennycook, Stephen
A1 León Yebra, Carlos
A1 Santamaría Sánchez-Barriga, Jacobo
AB Direct evidence for charge leakage at the interface of epitaxial SrTiO3/LaMnO3 superlattices with atomically sharp interfaces is provided. The direction of charge leakage can be reversed by changing the LMO/STO thickness ratio. This result will be important for the understanding of some of the reported limitations of oxide devices involving manganite/titanate interfaces.
PB Wiley
SN 0935-9648
YR 2010
FD 2010
LK https://hdl.handle.net/20.500.14352/91633
UL https://hdl.handle.net/20.500.14352/91633
LA eng
NO Garcia‐Barriocanal, J., Bruno, F.Y., Rivera‐Calzada, A., Sefrioui, Z., Nemes, N.M., Garcia‐Hernández, M., Rubio‐Zuazo, J., Castro, G.R., Varela, M., Pennycook, S.J., Leon, C., Santamaria, J.: “Charge Leakage” at LaMnO 3 /SrTiO 3 Interfaces. Advanced Materials. 22, 627-632 (2010). https://doi.org/10.1002/adma.200902263
NO Ministerio de Ciencia, Innovación y Universidades (España)
DS Docta Complutense
RD 10 abr 2025