TY  - JOUR
AU  - Pal, U
AU  - Pere, J. L.
AU  - Piqueras de Noriega, Javier
AU  - Diéguez, E.
PY  - 1996
DO  - 10.1016/S0921-5107(96)01725-4
SN  - 0921-5107
UR  - https://hdl.handle.net/20.500.14352/59224
T2  - Materials Science and Engineering B-Solid State Materials for Advanced Technology
AB  - The contactless modulation spectroscopy technique of photoreflectance (PR) has been used to study the near band edge   transitions in CdTe, CdTe:V and CdTe:Ge bulk crystals in the range of 14 and 400 K for the first time. The lineshape of the PR...
LA  - eng
M2  - 297
PB  - Elsevier Science Sa
KW  - Electroreflectance
KW  - Gaas
KW  - Defects
KW  - Field
TI  - Near band gap photoreflectance studies in CdTe, CdTe:V and CdTe:Ge crystals
TY  - journal article
VL  - 42
ER  -