RT Book, Section
T1 Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
A1 López Calle, Isabel
A1 Franco Peláez, Francisco Javier
A1 Agapito Serrano, Juan Andrés
A1 González Izquierdo, Jesús
AB One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.
PB IEEE-Inst Electrical Electronics Engineers Inc
SN 978-1-4244-7863-7
YR 2011
FD 2011-02-08
LK https://hdl.handle.net/20.500.14352/45552
UL https://hdl.handle.net/20.500.14352/45552
LA eng
NO © IEEE.Spanish Conference on Electron Devices (CDE) (8.2011. Palma de Mallorca, España)
NO Ministerio de Educación y Ciencia
DS Docta Complutense
RD 27 abr 2025