RT Book, Section T1 Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices A1 López Calle, Isabel A1 Franco Peláez, Francisco Javier A1 Agapito Serrano, Juan Andrés A1 González Izquierdo, Jesús AB One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients. PB IEEE-Inst Electrical Electronics Engineers Inc SN 978-1-4244-7863-7 YR 2011 FD 2011-02-08 LK https://hdl.handle.net/20.500.14352/45552 UL https://hdl.handle.net/20.500.14352/45552 LA eng NO © IEEE.Spanish Conference on Electron Devices (CDE) (8.2011. Palma de Mallorca, España) NO Ministerio de Educación y Ciencia DS Docta Complutense RD 5 abr 2025