TY  - CHAP
AU  - López Calle, Isabel
AU  - Franco Peláez, Francisco Javier
AU  - Agapito Serrano, Juan Andrés
AU  - González Izquierdo, Jesús
PY  - 2011
DO  - 10.1109/SCED.2011.5744202
SN  - 978-1-4244-7863-7
UR  - https://hdl.handle.net/20.500.14352/45552
AB  - One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network...
LA  - eng
M2  - 1
PB  - IEEE-Inst Electrical Electronics Engineers Inc
KW  - Analogue circuits
KW  - Circuit reliability
KW  - Resistors
KW  - Transients
KW  - Analog electronic devices
KW  - Analog electronic systems reliability
KW  - Energetic ions
KW  - Load resistor
KW  - Network loading
KW  - Single-event transients
KW  - Spatial missions
KW  - Spurious transients
KW  - Worst-case parameter
KW  - Operational amplifiers
KW  - SPICE
KW  - Shape
KW  - Transient analysis
KW  - Transistors
KW  - Voltage measurement
KW  - Analog devices
KW  - Bipolar technology
KW  - Laser tests
KW  - Single event transients
KW  - System reliability
KW  - Two-photon absorption
TI  - Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
TY  - book part
ER  -